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ALLCHIPS ELECTRONICS LIMITED

Texas Instruments SN74BCT8374ANTG4

SN74BCT8374ANTG4


  • Manufacturer: Texas Instruments
  • Origchip NO: SN74BCT8374ANTG4
  • Package: 24-DIP (0.300", 7.62mm)
  • Datasheet: pdfPDF
  • Stock: 9414
  • Description: SN74BCT8374ANTG4(Kg)

Quantity:

In Stock

Please send RFQ , we will respond immediately.

Purchase & Inquiry

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Means of Payment

For your convenience, we accept multiple payment methods in USD, including PayPal, Credit Card, and wire transfer.

RFQ (Request for Quotations)

It is recommended to request for quotations to get the latest prices and inventories about the part.
Our sales will reply to your request by email within 24 hours.

IMPORTANT NOTICE

1. You'll receive an order information email in your inbox. (Please remember to check the spam folder if you didn't hear from us).
2. Since inventories and prices may fluctuate to some extent, the sales manager is going to reconfirm the order and let you know if there are any updates.

Shipping Cost

Shipping starts at $40, but some countries will exceed $40. For example (South Africa, Brazil, India, Pakistan, Israel, etc.)
The basic freight (for package ≤0.5kg or corresponding volume) depends on the time zone and country.

Shipping Method

Currently, our products are shipped through DHL, FedEx, SF, and UPS.

Delivery Time

Once the goods are shipped, estimated delivery time depends on the shipping methods you chose:

FedEx International, 5-7 business days.

The following are some common countries' logistic time.

SPECIFICATIONS

Parameters
Mfr Texas Instruments
Series 74BCT
Package Tube
Product Status Obsolete
Logic Type Scan Test Device with D-Type Edge-Triggered Flip-Flops
Supply Voltage 4.5V ~ 5.5V
Number of Bits 8
Operating Temperature 0°C ~ 70°C
Mounting Type Through Hole
Package / Case 24-DIP (0.300", 7.62mm)
Supplier Device Package 24-PDIP
Base Product Number 74BCT8374
RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) 1 (Unlimited)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8542.39.0001
Standard Package 60
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-PDIP

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